An Effect of Precursor Concentration on ZnO Thin Films Prepared by Dip Coating Method | Chapter 08 | New Insights on Chemical Research Vol. 1
Zinc Oxide (ZnO) thin films have been successfully coated onto glass substrates at various solutions concentration (0.1 M, 0.2 M and 0.3 M) by Low cost SILAR coating technique. The film thickness was estimated using weight gain method and it revealed that the film thickness increased with solution concentration values. The prepared film structural, morphological and optical properties were studied using X-ray diffraction (XRD), scanning electron microscope (SEM) and UV-Vis-NIR spectrophotometer respectively. The structure of the films were found to be hexagonal structure with polycrystalline in nature with preferential orientation along (002) plane. X-ray line profile analysis was used to evaluate the micro structural parameters such as crystallite size, micro strain, dislocation density and stacking fault probability. The value of the crystalline size is increased by increasing the concentration of the solution. The average crystalline size was estimated at in the range of 26 nm to...