Yield Stability and Adaptability of 25 Grain Sorghum B-Lines across Six Environments in Egypt Using AMMI and GGE-Biplot Models | Chapter 05 | Advances in Agriculture and Fisheries Research Vol. 1
Presence of G×E interaction reduces the
correlation between genotypic and phenotypic parameters and complicates
progress of selection. Among several methods proposed for evaluation of the GE
interaction, the AMMI and GGE-biplot are the most informative models. The
objective of this study was to estimate the G×E interaction in sorghum parental
lines and to identify sorghum B-lines of stability and adaptability across
different environments using the AMMI and GGE-biplot models. Six environments
with 25 sorghum B-lines were conducted at two locations in Egypt (Giza and
Shandaweel) in two years and two planting dates in one location (Giza). A
randomized complete block design was used in each environment (yield trial)
with three replications. The AMMI analysis of variance indicated that the
genotype (G), environment (E) and GE interaction had significant influence
(p≤0.01) on sorghum grain yield. Based on AMMI model, BTX TSC-20 followed by
ICSB-1808 showed both high yielding and stability across the test environments.
However, ICSB-8001 (G11) and BTX-407 (G21), showed maximum stability, but with
moderate grain yield. Based on GGE-biplot method, BTX TSC-20 (G25) was the
winning genotype for the mega-environment which consists of E1 and E3, ICSB-14
(G3) for the mega-environment (E2 and E4), while BTX 2-1 (G20) for E5 mega-environment,
ICSB-88003 (G12) and ICSB-70 (G6) for the mega-environment E6. These genotypes
are the most adapted to the respective environments.
Author(s) Details
Dr. Ahmed Medhat Mohamed
Al-Naggar
Department of Agronomy,
Faculty of Agriculture, Cairo University, Egypt.
Rabie Mohamed Abd El-Salam
Department of Agronomy,
Faculty of Agriculture, Cairo University, Egypt.
Walaa Yaseen Saad Yaseen
Agricultural Research Centre
(ARC), Department of Grain Sorghum Research, Field Crops Research Institute,
Giza, Egypt.
View Volume: http://bp.bookpi.org/index.php/bpi/catalog/book/138
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